The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2010
Filed:
May. 11, 2006
Applicants:
Peijun Cong, Shanghai, CN;
Zhuo Wang, Shanghai, CN;
Youqi Wang, Palo Alto, CA (US);
Inventors:
Assignee:
Yashentech Corporation, Shanghai, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01D 39/00 (2006.01); B01D 59/38 (2006.01); B07B 1/46 (2006.01); B65B 3/04 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention discloses a high throughput screening method and system, which can be used to screen a plurality of fluid samples to ascertain their corresponding information. For example, a polymer solution sample is screened to ascertain information about its micro structure character such as including its crystallinity property. The high throughput screen system comprises a plurality of sampling passages and one or more screening devices for screening multiple samples simultaneously or almost simultaneously to get their corresponding information so as to meet research requirement of the relevant field.