The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2010

Filed:

Mar. 01, 2007
Applicants:

James S. Felton, Danville, CA (US);

Kuang Jen J. Wu, Cupertino, CA (US);

Mark G. Knize, Tracy, CA (US);

Kristen S. Kulp, Livermore, CA (US);

Joe W. Gray, San Francisco, CA (US);

Inventors:

James S. Felton, Danville, CA (US);

Kuang Jen J. Wu, Cupertino, CA (US);

Mark G. Knize, Tracy, CA (US);

Kristen S. Kulp, Livermore, CA (US);

Joe W. Gray, San Francisco, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of analyzing biological material by exposing the biological material to a recognition element, that is coupled to a mass tag element, directing an ion beam of a mass spectrometer to the biological material, interrogating at least one region of interest area from the biological material and producing data, and distributing the data in plots.


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