The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7728273 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 01, 2010

Filed:

Jan. 10, 2007
Applicants:

Randy Hemingway, Pflugerville, TX (US);

Aubrey K. Sparkman, Austin, TX (US);

Inventors:

Randy Hemingway, Pflugerville, TX (US);

Aubrey K. Sparkman, Austin, TX (US);

Assignee:

Dell Products, LP, Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 40/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A non-destructive test structure for printed circuit board characterization and method of testing the same are disclosed. In one form, a method for testing a printed circuit board can include applying a test signal to a first test location of a first test structure associated with a first inner bus layer of a printed circuit board. The method can also include measuring a crosstalk voltage at a second test location operably associated with the first test structure. The method can further include comparing the crosstalk voltage to a crosstalk specification of the printed circuit, board.


Find Patent Forward Citations

Hemingway, Randy. (2010). Information handling system and printed circuit board having test structure for measuring a crosstalk voltage (U.S. Patent No. 7728273). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7728273

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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