The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2010
Filed:
Feb. 28, 2002
Yixian Qin, Port Jefferson Station, NY (US);
Clinton Rubin, Port Jefferson, NY (US);
Wei Lin, Port Jefferson, NY (US);
Yixian Qin, Port Jefferson Station, NY (US);
Clinton Rubin, Port Jefferson, NY (US);
Wei Lin, Port Jefferson, NY (US);
The Research Foundation of State University of New York, Albany, NY (US);
Abstract
The invention comprises a system and method for determining at least one material property of a material sample (such as a bone sample) at at least one point. The system includes a transmitting ultrasonic transducer and a receiving ultrasonic transducer, both transducers being confocal transducers. The transducers are configured to receive the material sample therebetween such that the confocal point of the transducers are located at the at least one point in the material sample. A processor initiates an ultrasonic signal from the transmitting transducers that is transmitted trough the at least one point of the material sample when positioned between the transducers. The ultrasonic signal is received by the receiving transducing and the processor in turn receives a signal reflecting one or more measures of the received ultrasonic signal. The processor determines at least one ultrasonic parameter for the at least one point of the material sample based upon the transmitted and received ultrasonic signals. The processor further determines the at least one material property at the point of the sample based upon the at least one ultrasonic parameter.