The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 01, 2010

Filed:

Jul. 25, 2006
Applicants:

Kunio Ikefuji, Kyoto, JP;

Tsuyoshi Okuda, Kyoto, JP;

Inventors:

Kunio Ikefuji, Kyoto, JP;

Tsuyoshi Okuda, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/38 (2006.01);
U.S. Cl.
CPC ...
Abstract

A printing apparatus records a predetermined test pattern on printing paper, and reads the test pattern by means of a scanner. The scanner reads the test pattern at a resolution lower than the resolution of a recording head. This allows the automatic and fast reading of the test pattern. Additionally, the printing apparatus performs an interpolation process on read data, and judges whether there is an abnormality in nozzles or not, based on the read data subjected to the interpolation process. This reproduces the positions of and spacing between lines recorded on the printing paper with high accuracy to achieve the exact judgment as to whether there is an abnormality in the nozzles or not. Therefore, an inspection with a high degree of reliability is accomplished.


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Ikefuji, Kunio. (2010). Printing apparatus, method of inspecting nozzles for abnormalities, and program (U.S. Patent No. 7726760). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7726760

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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