The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 01, 2010
Filed:
Dec. 28, 2007
Qing Liu, Shenzhen, CN;
Jun-qi LI, Shenzhen, CN;
Takeo Nakagawa, Tokyo, JP;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzzhen, Guangdong Province, CN;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien, TW;
Abstract
An exemplary contour measuring probe includes a guide (), a movable rack, a counter-balancing mechanism, a linear measuring scale (), and a displacement sensor (). The movable rack comprises a tip extension () for touching a surface of an object. The tip extension () is pushed to move towards the object under a gravitational force acting on the movable rack. The counter-balancing mechanism is configured to partially counter balance the gravitational force acting on the movable rack. The linear measuring scale () displays values of displacements of the tip extension (). The displacement sensor () detects and reads the displacement values displayed by the linear measuring scale ().