The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2010
Filed:
Sep. 22, 2008
Robert W. Wells, Cupertino, CA (US);
Shekhar Bapat, Cupertino, CA (US);
Tassanee Payakapan, Toronto, CA;
Shahin Toutounchi, Pleasanton, CA (US);
Robert W. Wells, Cupertino, CA (US);
Shekhar Bapat, Cupertino, CA (US);
Tassanee Payakapan, Toronto, CA;
Shahin Toutounchi, Pleasanton, CA (US);
Xilinx, Inc., San Jose, CA (US);
Abstract
A method of testing a programmable device begins by programming at least a portion of the programmable device in accordance with at least a portion of an application to produce a programmed circuit, wherein the programmed circuit includes an input sequential element and an output sequential element. The method continues by providing a test input to the programmed circuit. The method continues by triggering the input sequential element to temporarily store the test input based on a first edge of the test clock. The method continues by triggering the output sequential element to temporarily store a test output of the programmed circuit based on a second edge of the test clock. The method continues by capturing the test output of the programmed circuit in accordance with the second edge of the test clock.