The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2010

Filed:

Dec. 28, 2006
Applicants:

Scott Shelton, Apex, NC (US);

Henry Fu, Chapel Hill, NC (US);

Michael Chaves, Cary, NC (US);

Leslie Mannion, Wake Forest, NC (US);

Robert Baril, Apex, NC (US);

Inventors:

Scott Shelton, Apex, NC (US);

Henry Fu, Chapel Hill, NC (US);

Michael Chaves, Cary, NC (US);

Leslie Mannion, Wake Forest, NC (US);

Robert Baril, Apex, NC (US);

Assignee:

Teradata US, Inc., Miamisburg, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques for applying segment conditions to measure results are presented. Row and column segment data is acquired from a database according to row and column definitions. A measure calculation is applied against the intersecting row and column segment data. Next, one or more combinations or conditions derived from the row and column definitions are used as a filter to produce filtered results.


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