The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2010
Filed:
Oct. 07, 2004
Julian Van Erlach, Fort Worth, TX (US);
Christophe Faugere, Gansevoort, NY (US);
Julian Van Erlach, Fort Worth, TX (US);
Christophe Faugere, Gansevoort, NY (US);
Other;
Abstract
A method, computer system, and computer program product for performing an asset analysis for at least one asset, using the Required Yield Method (RYM). The method provides first economic data relating to a first economy. The economic data includes a gross domestic product (GDP) per capita growth rate for the first economy. The economic data may further include an expected inflation rate for the first economy over a time interval. At least one asset characteristic (e.g, asset valuation) of each asset of the least one asset is computed. The at least one asset characteristic is a function of a portion of the economic data. The computing is in accordance with the RYM. The computed at least one asset characteristic is transferred to a tangible medium. The at least one asset may include an equity index, a bond, gold, a currency, a derivative, etc.