The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2010
Filed:
Aug. 15, 2007
Ken'ichi Okuno, Kakogawa, JP;
Hiroyuki Morihara, Kobe, JP;
Tadayuki Yamaguchi, Kobe, JP;
Tomomi Sugiyama, Kobe, JP;
Ken'ichi Okuno, Kakogawa, JP;
Hiroyuki Morihara, Kobe, JP;
Tadayuki Yamaguchi, Kobe, JP;
Tomomi Sugiyama, Kobe, JP;
Sysmex Corporation, Kobe, JP;
Abstract
The present invention quickly resolves troubles in an analyzer and performs effective external quality control management. An analyzer () and a control device () are connected by a network (). Error data and sample data taken from assay of a quality control substance are transmitted from the control device () to the analyzer (). The analyzer () is made to be remotely operable from the control device () and when troubles arise repair from the control device () is possible. The control device () tallies sample data, and provides the tally results to a Web page. The analyzer () accesses the Web page using a WWW browser, and can perform external quality control in real time.