The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2010

Filed:

Oct. 25, 2005
Applicants:

Larry Lee Hendrickson, Naperville, IL (US);

Terence Daniel Pickett, Waukee, IA (US);

Stephen Michael Faivre, Kingston, IL (US);

Inventors:

Larry Lee Hendrickson, Naperville, IL (US);

Terence Daniel Pickett, Waukee, IA (US);

Stephen Michael Faivre, Kingston, IL (US);

Assignee:

Deere & Company, Moline, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for dividing a field into zones with similar crop attributes and developing a mission plan for steering the harvester to selectively harvest crops based on one or more of the attributes. The attributes include protein level, starch level, oil level, sugar content, moisture level, digestible nutrient level, or any other crop characteristic of interest. The method can be applied to selectively harvest and/or segregate according to attribute any crop, including grains such as wheat, corn, or beans, fruits such as grapes, and forage crops. Directed crop sampling provides absolute value and variance information for segregated batches of harvested crop.


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