The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2010
Filed:
Aug. 24, 2006
Applicants:
Curtis J. Petrich, Minneapolis, MN (US);
David V. Hansen, Eden Prairie, MN (US);
Inventors:
Curtis J. Petrich, Minneapolis, MN (US);
David V. Hansen, Eden Prairie, MN (US);
Assignee:
Honeywell International Inc., Morristown, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of processing altitude measurements for an aircraft is disclosed. The method involves filtering raw altimeter data within an altimeter to substantially limit random variations in the altitude measurements for one or more altimeter measurement profiles.
Petrich, Curtis. (2010). Adaptive filtering for altimeters (U.S. Patent No. 7725220). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7725220
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile