The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2010

Filed:

Dec. 19, 2002
Applicants:

Georg Schmitz, Wachtberg, DE;

Henning Braess, Aachen, DE;

Harald Reiter, Aachen, DE;

Inventors:

Georg Schmitz, Wachtberg, DE;

Henning Braess, Aachen, DE;

Harald Reiter, Aachen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image system, notably an X-ray system and an ultrasound system, is provided in which images or sequences of images are generated and used to automatically change or optimize the operational behavior of individual image system components. Measurement fields are defined in the images of an image sequence by means of a data processing unit. Information is extracted from the measurement fields in order to adapt the system components. More specifically, in the course of a sequence of images the measurement fields are adapted or shifted in conformity with the motion of objects.


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