The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2010

Filed:

Oct. 27, 2003
Applicants:

Itaru Furukawa, Kyoto, JP;

Shinichi Maeda, Kyoto, JP;

Setsuo Ohara, Kyoto, JP;

Inventors:

Itaru Furukawa, Kyoto, JP;

Shinichi Maeda, Kyoto, JP;

Setsuo Ohara, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06K 9/00 (2006.01); G06K 9/36 (2006.01); G06K 9/40 (2006.01); G06K 9/54 (2006.01); G03B 27/68 (2006.01);
U.S. Cl.
CPC ...
Abstract

Plate-image-inspection RIP data CD, CDare prepared using the same RIP processing conditions from two print image data prepared in different steps of the prepress process, and inspection results are obtained by comparing these data CD, CD. Plate-image-inspection RIP data CD, CDcan be prepared in several methods: (1) a method for RIP processing respective non-RIP data using standard RIP processing conditions; (2) a method for respectively converting two RIP data to standard RIP processing conditions; and (3) a method for converting one of two RIP data such that it conforms to the RIP processing conditions of the other.


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