The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2010
Filed:
Oct. 19, 2007
Kadri Nazar Jabri, Waukesha, WI (US);
Rowland Frederick Saunders, Hartland, WI (US);
John Michael Sabol, Sussex, WI (US);
Gopal Biligeri Avinash, Menomonee, WI (US);
Kadri Nazar Jabri, Waukesha, WI (US);
Rowland Frederick Saunders, Hartland, WI (US);
John Michael Sabol, Sussex, WI (US);
Gopal Biligeri Avinash, Menomonee, WI (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A technique for establishing texture metrics and bone mineral density (BMD) within an anatomical region of interest. A digital imaging system is used to acquire a standard digital X-ray image with a wide field of view. The standard digital X-ray image is used to guide the imaging system to obtain an image of a region of interest. The standard digital X-ray image is used to calculate various texture metrics, such as a length of a fracture. A dual-energy digital X-ray image of the region of interest is acquired. The dual-energy digital X-ray image is corrected for scatter. The BMD of the region of interest may be established from the scatter-corrected dual-energy digital X-ray image. The BMD, the texture metrics, and/or the scatter-corrected dual-energy X-ray image may be displayed on the standard digital X-ray image.