The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2010
Filed:
Jul. 22, 2006
Applicant:
Ulrich Sander, Rebstein, CH;
Inventor:
Ulrich Sander, Rebstein, CH;
Assignee:
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention relates to a microscope () having an illumination apparatus () having a light source () and an optical system. The light source () is embodied to output a coherent light beam bundle along a defined illumination beam path (), and the optical system in the illumination beam path () encompasses a spatial light modulator () for modifying the illuminated field (). A surgical microscope () is preferably equipped with an illumination apparatus () of this kind that is arranged adjustably in two directions on the surgical microscope ().