The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2010
Filed:
May. 11, 2006
Tsunemi Tokieda, Yokohama, JP;
Tsunemi Tokieda, Yokohama, JP;
Showa Denko K.K., Tokyo, JP;
Abstract
The invention provides an apparatus for measuring the differential refractive index for liquid chromatography which greatly improves the sensitivity while having quick responsiveness to refractive index difference of sample liquid, as well as a differential refractive index detector and a measurement method for a differential refractive index using the same. The apparatus for measuring a differential refractive index having a flow cell deflecting a measurement beam in accordance with the refractive index difference between a reference liquid and a sample liquid for measuring the change of the deflection angle on the basis of the refractive index difference of the measurement beam transmitted between the reference liquid and the sample liquid, wherein the flow cell comprises three independent chambers including a first chamber, a second chamber adjacent to the first chamber and a third chamber adjacent to the second chamber.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile