The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2010
Filed:
Dec. 31, 2007
Applicants:
Andrew Marshall, Dallas, TX (US);
David Brian Aldrich, Allen, TX (US);
Inventors:
Andrew Marshall, Dallas, TX (US);
David Brian Aldrich, Allen, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
Systems and methods are provided for contactless testing of a wafer containing at least one integrated circuit. A test component responds to a supply voltage to indicate at least one property of the wafer. A voltage source wirelessly receives power from an external source and produces the supply voltage. A reference generator generates a reference voltage, having a known magnitude, from the supply voltage. A voltage evaluation component modifies the response of the test component as to represent a magnitude of the supply voltage.