The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2010

Filed:

Sep. 21, 2006
Applicants:

A Hans Vija, Evanston, IL (US);

James T. Chapman, Glen Ellyn, IL (US);

John Thomas Pawlak, Villa Park, IL (US);

Inventors:

A Hans Vija, Evanston, IL (US);

James T. Chapman, Glen Ellyn, IL (US);

John Thomas Pawlak, Villa Park, IL (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G12B 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Attenuation correction data is obtained from one or more transmission sources to calculate the attenuation factors of a reconstruction area of an object being imaged by a nuclear medicine apparatus, such as a SPECT gamma camera. The transmission sources are capable of swiveling the direction of the transmission to correspond with the direction of capture of the gamma detectors. Additionally, the transmission sources are capable of linear movement to correspond with any linear movement of the detectors. The transmission sources are able to follow the same path as the detectors in order to determine the attenuation factors through the same reconstruction area being scanned by the detectors.


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