The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7723506 B1

PDF
Full Text
Expired
Date of Patent:
May. 25, 2010

Filed:

Jul. 13, 2006
Applicants:

Marcus Hartmann, Münster, DE;

Thomas Weide, Altenberge, DE;

Lutz Herrmann, Herne, DE;

Nadine Niebur, Münster, DE;

Inventors:

Marcus Hartmann, Münster, DE;

Thomas Weide, Altenberge, DE;

Lutz Herrmann, Herne, DE;

Nadine Niebur, Münster, DE;

Assignee:

Cilian AG, Munster, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C07H 21/04 (2006.01); C12P 21/06 (2006.01); C12N 15/74 (2006.01); C12N 15/00 (2006.01); A01N 43/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method characterizes samples having units by monitoring fluctuating intensities of radiation emitted, scattered, and/or reflected by the units in at least one measurement volume, the monitoring being performed by at least one detection device, the method comprising the steps of: a) measuring in a repetitive mode a number of photon counts per time interval of defined length, b) determining a function of the number of photon counts per the time interval, and c) determining a function of specific brightness of the units on basis of the function of the number of photon counts.


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