The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2010
Filed:
Aug. 30, 2005
Hirohiko Tsuzuki, Kanagawa, JP;
Hirohiko Tsuzuki, Kanagawa, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
It is an object of the present invention to provide a method for analyzing the interaction of a test substance with a ligand by analyzing a phenomenon whereby multiple test substances are simultaneously adsorbed to a ligand. The present invention provides a method for analyzing the interaction of test substances with a ligand by measuring the change in the surface plasmon resonance using a surface plasmon resonance measurement device wherein the above-described method comprises: supplying a solution containing two or more types of test substances after supplying a solution containing no test substances; measuring the change in the surface plasmon resonance; and analyzing the difference between the change in the surface plasmon resonance that is predicted from the adsorption rate constant (ka) and dissociation rate constant (kd) of each of the test substances that had previously been measured and the change in the surface plasmon resonance that has actually been measured.