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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7722928 B1

PDFFull Text
Expired
Date of Patent:
May. 25, 2010

Filed:

Apr. 07, 2005

Nanolithography methods and products therefor and produced thereby

Applicants:

Chad A. Mirkin, Wilmette, IL (US);

Seunghun Hong, Chicago, IL (US);

Vinayak P. Dravid, Glenview, IL (US);

Inventors:

Chad A. Mirkin, Wilmette, IL (US);

Seunghun Hong, Chicago, IL (US);

Vinayak P. Dravid, Glenview, IL (US);

Assignee:

Northwestern University, Evanston, IL (US);

Attorney:

Foley & Lardner LLP

Primary Examiner:

Michael Kornakov

Assistant Examiner:

Alexander Weddle

Int. Cl.
CPC ...
B05D 5/00 (2006.01); B05D 1/36 (2006.01); B05D 7/24 (2006.01); B01J 19/08 (2006.01); C12Q 1/68 (2006.01); C12P 19/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one aspect, a method of nanolithography is provided using a driving force to control the movement of a deposition compound from a scanning probe microscope tip to a substrate. Another aspect of the invention provides a tip for use in nanolithography having an internal cavity and an aperture restricting movement of a deposition compound from the tip to the substrate. The rate and extent of movement of the deposition compound through the aperture is controlled by a driving force.

Find Patent Forward Citations

Mirkin, Chad. (2010). Nanolithography methods and products therefor and produced thereby (U.S. Patent No. 7722928). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7722928

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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