The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2010
Filed:
Nov. 30, 2006
Nihat Kurkcu, Istanbul, TR;
Oleksandr Golyk, Kocaeli, TR;
Ugur Tezcan, Istanbul, TR;
Ayse Kandemir, Istanbul, TR;
Nihat Kurkcu, Istanbul, TR;
Oleksandr Golyk, Kocaeli, TR;
Ugur Tezcan, Istanbul, TR;
Ayse Kandemir, Istanbul, TR;
General Electric Company, Schenectady, NY (US);
Abstract
Ultrasonic inspection system, method, and apparatus for subsurface ultrasonic inspection of curved objects. The inspection system includes an apparatus having a support structure for supporting a selected transducer and a selected acoustic mirror adapted for immersion in a coupling fluid. The total inspection path distance for the ultrasonic radiation includes a first portion defined by the transducer-to-mirror distance, and a second portion including the mirror-to-object distance. The first and second portions may be relatively adjusted within a constant total inspection path distance to focus the ultrasonic radiation at a desired subsurface depth. Selection of the transducer is at least partly dependent on subsurface depth of the desired inspection zone. Selection of the acoustic mirror is at least partly dependent on the selected transducer, the total inspection path distance, and curvature of the inspection object.