The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2010
Filed:
Nov. 11, 2005
Makoto Shirai, Ibaraki, JP;
Hiroshi Miyamoto, Chiba, JP;
Shigeyuki Matsubara, Osaka, JP;
Abstract
An ultrasonic test method for detecting a defective portion more precisely in a noncontact reflection way, and ultrasonic test instrument used for the method. An ultrasonic wave is transmitted from a transmitter (()) provided on one side of an object under test, and the reflected wave is received by a receiver (()) provided on the same side. The ultrasonic wave is transmitted/received through an air layer between the transmitter and the object () under test and between the receiver and the object (). The relative positions of the transmitter (), the receiver (), and the object () are so determined that the air propagation time ta of the air path (RA) between the transmitter and the receiver is longer than the propagation time tb of the reflected wave in the reflection path (RB). The propagation of the ultrasonic wave through the solid body between the transmitter and the receiver is blocked. This invention is suitable to test laminated material () such as a laminate of CFRP () and insulation () in a noncontact way.