The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7721347 B1

PDF
Full Text
Expired
Date of Patent:
May. 18, 2010

Filed:

May. 22, 2008
Applicant:

Peter J. Burke, Irvine, CA (US);

Inventor:

Peter J. Burke, Irvine, CA (US);

Assignee:

RF Nano Corporation, Newport Beach, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 13/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and device are provided for determining, without contact, the physical and electrical properties of nanotube materials. The device includes a scanning probe configured to generate a signal of certain frequency onto the nanotube material and measure a reflected signal from the nanotube material, and a processor coupled to the scanning probe and configured to determine the physical and electrical properties of the nanotube material from the measured reflected signal. The method includes positioning a scanning probe relative to the nanotube material, generating a signal of certain frequency onto the nanotube material, and measuring a reflected signal from the nanotube material.


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