The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2010

Filed:

Aug. 30, 2005
Applicants:

Alain J. Martin, Pasadena, CA (US);

Wonjin Jang, Pasadena, CA (US);

Mika Nystroem, Pasadena, CA (US);

Inventors:

Alain J. Martin, Pasadena, CA (US);

Wonjin Jang, Pasadena, CA (US);

Mika Nystroem, Pasadena, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides circuits that are tolerant to soft errors, such as a single event upset (SEU). The circuits have a chain of permitted state changes. Redundant elements, including redundant literals and assignments, are designed and implemented in the circuit. The design is such that a disruption or change of state on a single element by an SEU will not change the state flow of a circuit or lead to impermissible state changes. In one embodiment, the invention is implemented in quasi-delay-insensitive (QDI) asynchronous circuits.


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