The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2010
Filed:
Mar. 29, 2006
Yoshihiro Mishima, Kobe, JP;
Terutaka Yauchi, Hiroshima, JP;
Yoshihiro Mishima, Kobe, JP;
Terutaka Yauchi, Hiroshima, JP;
Sysmex Corporation, Kobe, JP;
Abstract
A setting method relating to measurement of measuring apparatus that minimizes the modification locations in an application program when the setting functions are modified, analyzing system, data processing apparatus, and storage medium are provided. When an application program is executed, setting data are processed to setting item data, setting parameter data, and setting value data. A data tree is generated in which setting item data are the root nodes, setting parameter data are the intermediate nodes, and setting value data are the leaf nodes, and the settings of the application program and measuring apparatus are accomplished using this data tree.