The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2010

Filed:

Jan. 18, 2007
Applicants:

LI Hong, San Diego, CA (US);

Mark Takita, Menlo Park, CA (US);

W. Thomas Novak, Hillsborough, CA (US);

Inventors:

Li Hong, San Diego, CA (US);

Mark Takita, Menlo Park, CA (US);

W. Thomas Novak, Hillsborough, CA (US);

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 3/10 (2006.01); G03B 13/34 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
Abstract

A camera () for providing an adjusted image () of a scene () includes an apparatus frame (), an optical assembly (), a capturing system (), and a control system (). The optical assembly () is adjustable to alternatively be focused on a first focal area (A) and a second focal area (B) that is different than the first focal area (A). The capturing system () captures a first captured image (A) when the optical assembly () is focused at the first focal area (A) and captures a second captured image (B) when the optical assembly () is focused at the second focal area (B). The control system () provides the adjusted image () of the scene () based upon the first captured image (A) and the second captured image (B). Additionally, the control system () can perform object depth extraction of one or more objects () () () in the scene (). Alternatively, the multiple captured images (A) (B) can be adjusted by a separate adjustment system ().


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