The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2010
Filed:
Jun. 27, 2006
Karl-heinz Haase, Pfungstadt, DE;
Michael Schmidt, Wettenberg, DE;
Regis Blin, Giessen, DE;
Hottinger Baldwin Messtechnik GmbH, Darmstadt, DE;
Abstract
An optical strain gage () for multi-axis strain measurement includes at least two linear light waveguide sections () with Bragg gratings (). These are arranged next to one another in a prescribed angle () of 90° or 45° on a support layer () and are supplied with lightwaves by a common infeeding waveguide section (). All of the light waveguide sections() are provided preferably linearly on the support layer (), and a beam dispersion element () is arranged between the infeeding waveguide section () and the measuring waveguide sections () containing the Bragg grating ().
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