The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2010

Filed:

Sep. 08, 2006
Applicants:

LI Zhang, Los Angeles, CA (US);

Haizhou Ai, Beijing, CN;

Shuichiro Tsukiji, Kyoto, JP;

Shihong Lao, Kyoto, JP;

Inventors:

Li Zhang, Los Angeles, CA (US);

Haizhou Ai, Beijing, CN;

Shuichiro Tsukiji, Kyoto, JP;

Shihong Lao, Kyoto, JP;

Assignees:

Omron Corporation, Kyoto, JP;

Tsinghua University, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

Method and apparatus for face alignment by building a hierarchical classifier network. The hierarchical classifier network connects the tasks of face detection and face alignment into a smooth coarse-to-fine procedure. Texture classifiers are trained to recognize feature texture at different scales for different resolution layers. A multi-layer structure is employed to organize the texture classifiers, which begins with one classifier at the first layer and gradually refines the localization of feature points using additional texture classifiers in subsequent layers.


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