The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2010
Filed:
Mar. 16, 2006
Takatoshi Katahata, Soraku-gun, JP;
Hirotaka Wada, Nara, JP;
Toshihiro Moriya, Nara, JP;
Atsushi Shimizu, Yokohama, JP;
Akira Nakajima, Otsu, JP;
Takatoshi Katahata, Soraku-gun, JP;
Hirotaka Wada, Nara, JP;
Toshihiro Moriya, Nara, JP;
Atsushi Shimizu, Yokohama, JP;
Akira Nakajima, Otsu, JP;
OMRON Corporation, Kyoto, JP;
Abstract
In generating inspection logic of a new component, the image of a new component is obtained, the trend data for selected characteristics of the focused region of the new component is computed; a previously inspected component having characteristics similar to that of the new component is selected by comparing the trend data of the new component with trend data of the previously inspected component, the image of the selected (previously inspected) component is read from the storage device, and inspection logic for the new component is generated using the images of the new component and images of the previously inspected component as teaching data.