The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2010
Filed:
Aug. 14, 2006
Yoshiyuki Tani, Osaka, JP;
Hiroshi Iwamoto, Osaka, JP;
Takao Hisazumi, Osaka, JP;
Yukihiro Iwata, Osaka, JP;
Yoshiyuki Tani, Osaka, JP;
Hiroshi Iwamoto, Osaka, JP;
Takao Hisazumi, Osaka, JP;
Yukihiro Iwata, Osaka, JP;
Panasonic Corporation, Osaka, JP;
Abstract
An object of the present invention is to shorten the time required by processing, and to simplify the work and increase the number of samples processed, in the X-ray analysis of a specific substance contained in a sample. To achieve the object, a method for assaying the content of a specific substance in a sample, comprises a measurement step (S) of irradiating the samplewith X-rays, and measuring the spectrum of the sample, and an assay step (S) of comparing the components of the specific substance in the spectrum of the sampleand in a reference spectrum that has been pre-stored for the sample, and determining whether the specific substance is contained in the samplein an amount equal to or greater than a specific value.