The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2010
Filed:
Sep. 28, 2007
Joon-hyun Sung, Seoul, KR;
Joon-Hyun Sung, Seoul, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
An apparatus and method for measuring noise in a reception apparatus of a wireless communication system supporting Orthogonal Frequency Division Multiplexing (OFDM). The apparatus and method converts a preamble signal of a received OFDM frame into a frequency domain, and measures signal strength at each of subcarriers to which a null signal is allocated, from the preamble signal converted into the frequency domain. Further, the apparatus and method determines signal strength caused by noise depending on an average of signal strengths measured at the subcarriers. The preamble signal includes multiple subcarrier signals, and the subcarrier to which a null signal is allocated is a subcarrier over which no signal is transmitted by the transmission apparatus.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile