The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2010

Filed:

Jan. 09, 2008
Applicants:

Barry G. Mattox, Orlando, FL (US);

Gene D. Tener, Oviedo, FL (US);

Inventors:

Barry G. Mattox, Orlando, FL (US);

Gene D. Tener, Oviedo, FL (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention solves a problem of registration and improves signal-to-noise ratio (SNR) when using division-by-focal-plane array to produce multiple polarization images. This is achieved by processing a sequence of angular-position-dithered frames to generate a high-definition, Nyquist-sampled, integrated image for each of the polarizations. The integration method transforms individually under-sampled, high-resolution image frames into resultant high-resolution frames that meet the Nyquist sampling criterion. During the resampling transformation, each polarization or waveband is resampled to produce precise registration to the other polarizations, since registration offsets are fixed and defined by the arrangement of the polarized pixels in the focal-plane-array. In the most straight-forward implementation, these offsets would be integer pixel shifts in X and Y.


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