The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2010
Filed:
Dec. 13, 2007
Stefan Hell, Göttingen, DE;
Christian Eggeling, Göttingen, DE;
Gerald Donnert, München, DE;
Abstract
The inventive method for optically measuring a sample consists in temporarily repeatedly transmitting an electromagnetic signal () to the sample in such a way that a substance contained in the sample is transferred from a first electronic state () into a second electronic state (), wherein at least one part of said substance in the second state () emits photons which are used for carrying out the optical measurement of the sample, the signal () is transmitted to the same sample area at a certain repetition interval and said repetition interval of the signal () is adjusted with a lifetime of the second state () of the substance having an order of magnitude of 1 ns on a value of at least 0.1 μs which is optimized with respect to photon yield from the substance.