The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2010
Filed:
Feb. 26, 2007
Applicants:
Robert K. Grygier, Newark, DE (US);
Kelan Wieloch, Boothwyn, PA (US);
Inventors:
Robert K. Grygier, Newark, DE (US);
Kelan Wieloch, Boothwyn, PA (US);
Assignee:
Applied Extrusion Technologies, Inc., New Castle, DE (US);
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/00 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
Abstract
Methods for evaluating an optically variable device ('OVD') or optically variable media ('OVM') are disclosed. The methods include the steps of applying light of a single wavelength from a calibrated light source to the OVD or OVM; measuring the light diffracted by the OVD or OVM with an integrating sphere; measuring the total incident light on the OVD or OVM; and calculating a diffraction efficiency for the OVD or OVM at the single wavelength based on the measurement of light diffracted and the measurement of total incident light.