The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2010

Filed:

Dec. 29, 2006
Applicant:

Yu-cheng Huang, Hsinchu County, TW;

Inventor:

Yu-Cheng Huang, Hsinchu County, TW;

Assignee:

Altek Corporation, Hsinchu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An aberration compensation system for digital camera and a method therefor are provided, wherein the system includes an optical lens, an axial moving mechanism, a photosensitive element, and an image unit. The photosensitive element is loaded on the axial moving mechanism, and generates a first and a second image at a first and a second focus position. After receiving the first and second images, the image unit respectively calculates a first and a second image capture region and then synthesizes the two regions into a third image. The method includes using the optical lens to project the light beams of an object to be shot, generating the first image and second images, and capturing the distinct portions of the first and second images to be synthesized into the third image. Thereby, the system and method can solve the non-uniformity of the definitions at the center and periphery of each image.


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