The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2010
Filed:
Mar. 30, 2007
Robert E. Murac, Jr., Chester, CT (US);
Morton K. Pearson, Tolland, CT (US);
Robert E. Murac, Jr., Chester, CT (US);
Morton K. Pearson, Tolland, CT (US);
United Technologies Corporation, Hartford, CT (US);
Abstract
The method for identifying critical features as a function of process provides a way to identify critical features associated with a particular part, and to relate the effect of performing repair processes on the identified critical features. The method includes identifying critical features associated with the part, and determining the effect repair processes will have on the identified critical features. This information is included in a an output that is made available to repair centers. Based on the identification of critical features and the associated effect of repair processes on the identified critical features, repair centers are able to focus process and quality control resources on the identified critical features affected by a particular repair process.