The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2010
Filed:
Mar. 06, 2007
Hiromi Tsuchida, Kadoma, JP;
Akihiro Maejima, Kadoma, JP;
Jinsaku Kaneda, Kadoma, JP;
Eisaku Maeda, Kadoma, JP;
Hiromi Tsuchida, Kadoma, JP;
Akihiro Maejima, Kadoma, JP;
Jinsaku Kaneda, Kadoma, JP;
Eisaku Maeda, Kadoma, JP;
Panasonic Corporation, Osaka, JP;
Abstract
A testing method of semiconductor integrated circuit wherein the quality of diffusion for semiconductor chips can be tested before the semiconductor chips become packaged semiconductor integrated circuits is provided. Input data is set, and circuit current values I(L) and I(H) obtained for each of a plurality of circuit areas are compared with first test pass ranges I(L) and I(H) to extract articles within the first test pass (S), and the current values of the circuit areas determined to be articles within the first test pass and second test pass ranges I(L), and I(H) determined based on these current values are compared, thereby conducting a retest to extract circuit areas within the second test pass. The current values may be replaced by the voltage values.