The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2010

Filed:

Jan. 31, 2007
Applicant:

Albert J. Gregoritsch, Jr., South Burlington, VT (US);

Inventor:

Albert J. Gregoritsch, Jr., South Burlington, VT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/302 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for testing an integrated circuit device includes subjecting the integrated circuit device to an applied magnetic field during the application of one or more test signals, the applied magnetic field inducing magnetostriction effects in one or more materials comprising the integrated circuit device; and determining the existence of any defects within the integrated circuit device attributable to the applied magnetic field.


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