The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2010
Filed:
May. 29, 2007
Alan W. Hunt, Pocatello, ID (US);
J. Frank Harmon, Pocatello, ID (US);
Douglas P. Wells, Pocatello, ID (US);
Alan W. Hunt, Pocatello, ID (US);
J. Frank Harmon, Pocatello, ID (US);
Douglas P. Wells, Pocatello, ID (US);
Idaho State University and the Board of Educa, Pocatello, ID (US);
Abstract
The present invention is directed to a defect imaging device that has an energy beam that is directed at a device under test. The energy beam creates positrons deep within the material of the device under test. When the positrons combine with electrons in the material they produce a pair of annihilation photons. The annihilation photons are detected. The Doppler broadening of the annihilation photons is used to determine if a defect is present in the material. Three dimensional images of the device under test are created by directing the energy beam at different portions of the device under test.