The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2010
Filed:
Jun. 03, 2004
Applicants:
David Falabella, Merritt Island, FL (US);
James Juliano, Orlando, FL (US);
Walter B. May, Orlando, FL (US);
Valerie Potthoff, Windermere, FL (US);
Kevin F. Williams, Orlando, FL (US);
Inventors:
David Falabella, Merritt Island, FL (US);
James Juliano, Orlando, FL (US);
Walter B. May, Orlando, FL (US);
Valerie Potthoff, Windermere, FL (US);
Kevin F. Williams, Orlando, FL (US);
Assignee:
Lockheed Martin Corporation, Bethesda, MD (US);
Primary Examiner:
Int. Cl.
CPC ...
F42B 15/34 (2006.01); F41G 7/20 (2006.01); F41G 7/26 (2006.01); F42B 15/00 (2006.01); F41G 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A distributed aperture sensor system and sensing method comprising a plurality of sensors each having an aperture and window that provides electromagnetic interference shielding by a material with a bulk resistivity of less than or approximately equal to 10 ohm-cm that is substantially uniform throughout the window.