The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2010
Filed:
Jul. 31, 2006
Shamachary Sathish, Bellbrook, OH (US);
Richard Reibel, Dayton, OH (US);
John T. Welter, Fairborn, OH (US);
Charles Buynak, Tipp City, OH (US);
Shamachary Sathish, Bellbrook, OH (US);
Richard Reibel, Dayton, OH (US);
John T. Welter, Fairborn, OH (US);
Charles Buynak, Tipp City, OH (US);
University of Dayton, Dayton, OH (US);
Abstract
A non-contact thermo-elastic property measurement and imaging system and method thereof are described. Acoustic energy is incident on a first surface of a specimen under test. The acoustic energy is converted partially into heat by the specimen, causing a slight increase in the temperature in a region of interaction. The temperature increase is imaged using a high sensitivity infrared camera. Presence of defects (surface and subsurface) in the material modifies the distribution of temperature. An image of temperature distribution can be used for nondestructive testing and evaluation of materials. The temperature change in the specimen caused by acoustic excitation is related to thermal and elastic properties of the material. A measurement of the change in the temperature as a function of the amplitude of incident excitation can be used for direct measurement of thermo-elastic property of the specimen.