The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2010

Filed:

Aug. 02, 2005
Applicants:

Kalyanaraman Vaidyanathan, San Diego, CA (US);

Sajjit Thampy, La Jolla, CA (US);

Kenny C. Gross, San Diego, CA (US);

Inventors:

Kalyanaraman Vaidyanathan, San Diego, CA (US);

Sajjit Thampy, La Jolla, CA (US);

Kenny C. Gross, San Diego, CA (US);

Assignee:

Oracle America, Inc., Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system that identifies processes with a memory leak in a computer system. During operation, the system periodically samples memory usage for processes running on the computer system. The system then ranks the processes by memory usage and selects a specified number of processes with highest memory usage based on the ranking. For each selected process, the system computes a first-order difference of memory usage by taking a difference between the memory usage at a current sampling time and the memory usage at an immediately preceding sampling time. The system then generates a memory-leak index based on the first-order difference and a preceding memory-leak index computed at the immediately preceding sampling time.


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Vaidyanathan, Kalyanaraman. (2010). Method and apparatus for detecting memory leaks in computer systems (U.S. Patent No. 7716648). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7716648

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