The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2010
Filed:
Jun. 30, 2006
Edward E. Sprague, Woodside, CA (US);
Marco E. Sosa, San Jose, CA (US);
Daniel P. Murphy, Ben Lomond, CA (US);
Christopher C. Liou, Cupertino, CA (US);
Ting-kuang Chiang, Saratoga, CA (US);
Drew D. Perkins, Saratoga, CA (US);
Edward E. Sprague, Woodside, CA (US);
Marco E. Sosa, San Jose, CA (US);
Daniel P. Murphy, Ben Lomond, CA (US);
Christopher C. Liou, Cupertino, CA (US);
Ting-Kuang Chiang, Saratoga, CA (US);
Drew D. Perkins, Saratoga, CA (US);
Infinera Corporation, Sunnyvale, CA (US);
Abstract
The present invention provides a system, apparatus and method for accurately identifying optical or digital impairments on a span using FEC errors identified at an intermediary node. This information may be provided to an end node within a network to switch to a redundant path around the impaired optical path or span therein. In one embodiment of the invention, signal degradation is identified by analyzing FEC data within a FEC decoded signal at an intermediary node. An identification of signal degradation provides an indication of a potential failing span within an optical link, which may be provided in-band or out-of-band to a terminal node so that a signal may be switched around a failing path, or span therein, prior to an actual failure event.