The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2010
Filed:
Nov. 02, 2005
Keith Grimes, Colorado Springs, CO (US);
Todd Jeffrey Egbert, Colorado Springs, CO (US);
Edmund Paul Fehrman, Monument, CO (US);
Keith Grimes, Colorado Springs, CO (US);
Todd Jeffrey Egbert, Colorado Springs, CO (US);
Edmund Paul Fehrman, Monument, CO (US);
LSI Corporation, Milpitas, CA (US);
Abstract
A method and system for testing a modular data-processing component. Register information associated with a modular data-processing component to be tested at a test location can be identified and stored. The modular data-processing component can then be tested and removed from said test location. Thereafter, the register information can be retrieved and provided for use with testing of a new data-processing component at said test location without losing said register information during testing of multiple modular data-processing components. The register information can be, for example, PCI configuration data and the modular data-processing component can be an HAB.