The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2010
Filed:
May. 04, 2007
Stuart Owen Goldman, Scottsdale, AZ (US);
Richard E. Krock, Naperville, IL (US);
Karl F. Rauscher, Emmaus, PA (US);
James Philip Runyon, Wheaton, IL (US);
Stuart Owen Goldman, Scottsdale, AZ (US);
Richard E. Krock, Naperville, IL (US);
Karl F. Rauscher, Emmaus, PA (US);
James Philip Runyon, Wheaton, IL (US);
Alcatel-Lucent USA Inc., Murray Hill, NJ (US);
Abstract
Techniques are disclosed for measuring performance in processing systems such as communications systems and computing systems. For example, a method of measuring performance in a processing system having a plurality of processing devices includes the following steps. A measurement system coupled to the plurality of processing devices generates an interrupt signal. The measurement system applies the interrupt signal to a set of processing devices under test, wherein the set of processing devices under test is selected from the plurality of processing devices, such that each processing device of the set under test makes data available to the measurement system. The available data represents data associated with the execution of at least one function performed by each processing device of the set under test. The measurement system obtains the available data and utilizes at least a portion of the available data to determine a measure of performance associated with each of the processing devices of the set under test.