The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2010
Filed:
Feb. 03, 2006
Darpan Dinker, Union City, CA (US);
Herbert D. Schwetman, Austin, TX (US);
Jan L. Bonebakker, Mountain View, CA (US);
Darpan Dinker, Union City, CA (US);
Herbert D. Schwetman, Austin, TX (US);
Jan L. Bonebakker, Mountain View, CA (US);
Oracle America, Inc., Redwood Shores, CA (US);
Abstract
An application server may be instrumented to provide a resource measurement framework to collect resource usage data regarding request processing by the application server and applications executing on the application server. The resource measurement framework of an application server may collect hardware and software resource usage data regarding request processing at interception points located at interfaces between application components and services or other components of the application server by instrumenting those interfaces. The resource measurement framework may collect resource usage by instrumenting standard interfaces and/or methods of various specifications, such as implemented by containers or other components of the application server. Thus, the resource measurement framework may collect resource usage for applications or application components that do not include any resource measuring capabilities. The collected resource usage data may be parsed and combined to create an overall characterization of resource usage corresponding to the application server's request processing.