The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2010
Filed:
Dec. 07, 2006
Applicants:
Sung Hee Park, Daejeon, KR;
Dae Hee Kim, Daejeon, KR;
Chan Yong Park, Daejeon, KR;
Seon Hee Park, Daejeon, KR;
Inventors:
Sung Hee Park, Daejeon, KR;
Dae Hee Kim, Daejeon, KR;
Chan Yong Park, Daejeon, KR;
Seon Hee Park, Daejeon, KR;
Assignee:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Provided is a system for and method of extracting and clustering information. The system includes a clustering criterion designing unit that reconstructs a plurality of clustering criteria for each layer or applies weights to the plurality of clustering criteria in order to design a new clustering criterion, an input data processing unit that extracts characteristics from input data according to the new clustering criterion, and a clustering unit that performs clustering on the extracted characteristics.