The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2010

Filed:

Mar. 22, 2007
Applicants:

Frank D. Mcsherry, San Francisco, CA (US);

Kunal Talwar, San Francisco, CA (US);

Mark Steven Manasse, San Francisco, CA (US);

Inventors:

Frank D. McSherry, San Francisco, CA (US);

Kunal Talwar, San Francisco, CA (US);

Mark Steven Manasse, San Francisco, CA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques are provided that identify near-duplicate items in large collections of items. A list of (value, frequency) pairs is received, and a sample (value, instance) is returned. The value is chosen from the values of the first list, and the instance is a value less than frequency, in such a way that the probability of selecting the same sample from two lists is equal to the similarity of the two lists.


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